Dr. Gurcan has been elected to the grade of Senior Member of SPIE. SPIE considers Senior Members as "Members of distinction who will be honored for their professional experience, their active involvement with the optics community and SPIE, and/or significant performance that sets them apart from their peers." Dr. Gurcan has been elected to this grade because of his achievements in computer-assisted analysis of radiological and microscopic image analysis. Dr. Gurcan currently chairs SPIE Medical Imaging Digital Pathology Conference. In addition to being an SPIE senior member, he is also a senior member of IEEE and RSNA. Further information can be found in http://spie.org/x19144.xml and http://bmi.osu.edu/cialab/ .